Intrinsic-ID
PARTNERS:            HIS Initiative     |    Technology Partners     |    Subsidy Projects

 

 

Subsidy Projects:

 


Unique

Description:

The UNIQUE (Foundations for Forgery-Resistant Security Hardware) project aims at developing novel hardware components that can be uniquely identified in order to avoid unauthorized malicious counterfeiting.

Goals and Objectives:

The UNIQUE project tends to increase the protection of hardware systems against counterfeiting, cloning, tampering, reverse engineering and insertion of malicious components.
UNIQUE is to provide novel, strong, cost-effective and efficiently deployable technological means that

  • are sufficiently robust to provide high assurance for authenticity and trustworthiness of hardware components (Integrated Circuits (ICs))   manufactured in untrustworthy foundries while providing sensitive testing information and only to authorized parties
  • allow for monitoring and auditing hardware after delivery by the manufacturer
  • exploit physical properties at the (deep-) submicron and nano-scale of the underlying hardware not only to achieve unique device identification but also to detect small tempering and the presence of Trojans.

URL: http://www.unique-project.eu/

News: March 2011 newsletter

Partners: 

TECHNIKON, Ruhr-University Bochum, Katholieke Universiteit Leuven, TECHNISCHE UNIVERSITAET DARMSTADT, THALES, SIrrix AG, Intrinsic-ID, INTEL

TECHNIKON
Ruhr-University Bochum
Katholieke Universiteit Leuven
TECHNISCHE UNIVERSITAET DARMSTADT
THALES
SIrrix AG
Intrinsic-ID
INTEL

 

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RATE

Description:

The RATE (Reliability Assessment and test methods for anti-counterfeiting Technology) project aims firstly at modeling the impact that process variation, environmental parameters and aging have on SRAM PUFs and their reliability. Secondly it addresses the security vs. testability issue for PUF based secure key storage technology, aiming at the development of a secure design for testability.

Goals and Objectives:

The goal of the RATE project is to model SRAM memory in terms of its startup behavior, such that the influence of design parameters and environmental factors can be predicted and investigated. This is important knowledge for building products like SRAM-PUF based secure key storage systems. The two main objectives of the project are:

    • The development of tools for the reliability evaluation and assessment of SRAM PUF based products, focusing on the reliability and modeling of SRAM startup values;
    • The development of a 'secure' design for testability approaches that provide enough access to the chip (to guarantee higher fault coverage) while keep the secret information within the chip protected from counterfeiting.

 

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