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Zign RNG

Intrinsic ID Zign™ RNG is an embedded software IP solution that enables device manufacturers and designers to add a random number generator to their products without the need for hardware modifications. Random number generators are essential in many cryptographic operations, for example, to secure connections in settings such as IoT, automotive or datacenter. The Zign RNG product is compliant with the NIST SP 800-90 standard. It implements a deterministic random bit generator (DRBG) as specified in NIST SP 800-90A. The DRBG is seeded by a true random seed that is harvested from the noise in the SRAM physical unclonable function (PUF). This construction follows the NIST SP 800-90B specification.

Zign RNG is an embedded software implementation that leverages existing SRAM as a PUF, so it is the only hardware entropy source that does not need to be loaded at silicon fabrication. Zign RNG can be installed later in the supply chain, and even retrofitted on already-deployed devices. This enables a never-before-possible “brownfield” deployment of a cryptographically secure, NIST-certified RNG.

Zign RNG NIST Certified RNG With True Randomness From SRAM PUF

Features

  • Uses standard SRAM start-up values as a true random source
  • NIST CAVP certified for DRGB and AES
  • Compliant with NIST SP 800-90
  • Compliant with BSI AIS 20/31
  • Supports FIPS 140-3 certification

Benefits

  • No need for additional or modified silicon
  • Can be added at any point in the supply
    chain
  • Fits in resource-constrained embedded devices
  • Portable across different technologies

 

Zign RNG 1.0 
Code size

5.6 kB

SRAM required for PUF

2.1 kB

Performance on Arm Cortex-M4
- Initialize (run once after power-up)
- Get random (64 bytes)


2.4M clock cycles
4.1k clock cycles

Security strength

128 bits

Compliant with NIST SP 800-90
- Health checks
- Test interface

NIST CAVP certified (SP 800-90A)

Operational Range

The Intrinsic ID PUF-based solutions have been deployed on MCUs/SoCs/ASICs in a diverse set of foundry/process node combinations. SRAM PUF responses across this diverse array have been qualified for use in a wide range of operational environments, over years of field operation.

  • All major fabs from 0.35 μm to 5 nm
  • Temperature range from -55°C to 150°C
  • Voltage supply variation +/- 20%
  • Lifetime > 25 years

Zign RNG Deliverables

  • Library compiled for a specific target chip
  • User manual

Applications

  • Content protection
  • Authentication
  • Secure communications
  • Platform security
Related Info
White Papers
Press

“The approach of Zign RNG offers us a cost-effective way to generate true randomness on devices with limited resources by utilizing something that is already present, the SRAM. It has proven to provide our devices with the entropy that is needed to build our security solutions on,”

— Sean McGrath, Senior VP and General Manager, Connectivity and Audio Business Group at Dialog Semiconductor, a Renesas Company.

More Info

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